Step-induced optical anisotropy of vicinal Si(001)

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Publication Type Journal Article
School or College College of Engineering
Department Materials Science & Engineering
Creator Liu, Feng
Other Author Jaloviar, S. G.; Lin, Jia-Ling; Zielasek, V.; McCaugham, L.; Lagally, M. G.
Title Step-induced optical anisotropy of vicinal Si(001)
Date 1999-01
Description It is demonstrated, using reflectance difference spectroscopy, scanning tunneling microscopy, and low-energy electron diffraction, combined with deliberate straining of the surface, that the presence of atomic steps dramatically changes the optical anisotropy of the Si(001) surface. The step-induced reflectance difference signal originates predominately from rebonded steps and is comparable in magnitude to that of the terrace signal.
Type Text
Publisher American Physical Society
Journal Title Physical Review Letters
Volume 82
Issue 4
First Page 791
Last Page 794
DOI 10.1103/PhysRevLett.82.791
citatation_issn 0031-9007
Subject Step-induced; Optical anisotropy; Vicinal Si(001); Electron diffraction; Atomic steps
Subject LCSH Anisotropy; Reflectance spectroscopy; Scanning tunneling microscopy; Strain theory (Chemistry)
Language eng
Bibliographic Citation Jaloviar, S. G., Lin, J.-L., Liu, F., Zielasek, V., McCaugham, L., & Lagally, M. G. (1999). Step-induced optical anisotropy of vicinal Si(001). Physical Review Letters, 82(4), 791-4.
Rights Management (c) American Physical Society http://dx.doi.org/10.1103/PhysRevLett.82.791
Format Medium application/pdf
Format Extent 211,622 bytes
Identifier ir-main,12202
ARK ark:/87278/s6gx4vwp
Setname ir_uspace
ID 704751
Reference URL https://collections.lib.utah.edu/ark:/87278/s6gx4vwp