First-principles study of electronic properties of biaxially strained silicon: effects on charge carrier mobility

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Publication Type Journal Article
School or College College of Engineering
Department Materials Science & Engineering
Creator Liu, Feng
Other Author Yu, Decai; Zhang, Yu
Title First-principles study of electronic properties of biaxially strained silicon: effects on charge carrier mobility
Date 2008-12
Description Using first-principles method, we calculate the electronic band structure of biaxially strained silicon, from which we analyze the change in electron and hole effective mass as a function of strain and determine the mobility of electrons and holes in the biaxially strained silicon based on Boltzmann transport theory. We found that electron mobility increases with tensile strain and decreases with compressive strain. Such changes are mainly caused by a strain-induced change in electron effective mass, while the suppression of intervalley scattering plays a minor role. On the other hand, the hole mobility increases with both signs of strain and the effect is more significant for compressive strain because the hole effective mass decreases with compressive strain but increases with tensile strain. The strain-induced suppression of interband and intraband scatterings plays also an important role in changing the hole mobility.
Type Text
Publisher American Physical Society
Journal Title Physical Review B
Volume 78
Issue 24
First Page 245204-1
Last Page 245204-8
DOI 10.1103/PhysRevB.78.245204
citatation_issn 1098-0121
Subject Biaxially strained silicon; Boltzmann transport theory
Subject LCSH Silicon -- Electric properties; Strain theory (Chemistry); Transport theory
Language eng
Bibliographic Citation Yu, D., Zhang, Yu, & Liu, F. (2008). First-principles study of electronic properties of biaxially strained silicon: effects on charge carrier mobility. Physical Review B, 78(24), 245204-1-245204-8.
Rights Management (c) American Physical Society http://dx.doi.org/10.1103/PhysRevB.78.245204
Format Medium application/pdf
Format Extent 539,846 bytes
Identifier ir-main,12114
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Reference URL https://collections.lib.utah.edu/ark:/87278/s6m33dc5